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1

Design, Realization and Challenges of an Orbital Angular Momentum Sorter: A New Instrument for Phase Microscopy

Tavabi, Amir, Rosi, Paolo, Pozzi, Giulio, Roncaglia, Alberto, Frabboni, Stefano, Rotunno, Enzo, Lu, Peng Han, Nijland, Robert, Tiemeijer, Peter, Ghosh, Moumita, Karimi, Ebrahim, Dunin-Borkowski, Rafal

Journal:

Microscopy and Microanalysis

Year:

2020

File:

PDF, 419 KB

2020

2

A Need for Bandwidth Limitations in Electron Microscopes

Voelkl, Edgar, Tiemeijer, Peter

Journal:

Microscopy and Microanalysis

Year:

2014

Language:

english

File:

PDF, 1.42 MB

english, 2014

3

Precise beam-tilt alignment and collimation are required to minimize the phase error associated with coma in high-resolution cryo-EM

Robert M. Glaeser, Dieter Typke, Peter C. Tiemeijer, James Pulokas, Anchi Cheng

Journal:

Journal of Structural Biology

Year:

2011

Language:

english

File:

PDF, 735 KB

english, 2011

4

[IEEE 2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Boston, MA, USA (2015.10.26-2015.10.28)] 2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - QUBiC generation 9, a new BiCMOS process optimized for mmWave applications

Melai, Joost, Magnee, Peter, Pouwel, Ivo, Weijs, Pieter, Brunets, Ihor, van Dalen, Rob, Vohra, Anurag, Tiemeijer, Luuk, Pijper, Ralf, Tuinhout, Hans, Wils, Nicole, Cazana, Nicolae

Year:

2015

Language:

english

File:

PDF, 251 KB

english, 2015

5

First Applications of Electron Energy-Loss Spectroscopy with High Energy Resolution

Kothleitner, Gerald, Mitterbauer, Christoph, Grogger, Werner, Zandbergen, Henny, Tiemeijer, Peter, Freitag, Bert, Barfels, Melanie, Hofer, Ferdinand

Journal:

MRS Proceedings

Year:

2002

Language:

english

File:

PDF, 114 KB

english, 2002

6

Near-4D STEM with an Orbital Angular Momentum Sorter: Advantages and Challenges.

Rotunno, Enzo, Tavabi, Amir, Rosi, Paolo, Roncaglia, Alberto, Nijland, Robert, Ghosh, Moumita, Tiemeijer, Peter, Frabboni, Stefano, Dunin-Borkowski, Rafal, Grillo, Vincenzo

Journal:

Microscopy and Microanalysis

Year:

2020

File:

PDF, 471 KB

2020

7

Domain (Grain) Boundaries and Evidence of “Twinlike” Structures in Chemically Vapor Deposited Grown Graphene

An, Jinho, Voelkl, Edgar, Suk, Ji Won, Li, Xuesong, Magnuson, Carl W., Fu, Lianfeng, Tiemeijer, Peter, Bischoff, Maarten, Freitag, Bert, Popova, Elmira, Ruoff, Rodney S.

Journal:

Year:

2011

Language:

english

File:

PDF, 3.17 MB

english, 2011

8

Meson mass spectrum from relativistic equations in configuration space

Tiemeijer, Peter C., Tjon, J. A.

Journal:

Physical Review C

Year:

1994

Language:

english

File:

PDF, 1.18 MB

english, 1994

9

First Experimental Proof of Spatial Resolution Improvement in a Monochromized and Cs-Corrected TEM

Freitag, Bert, Kujawa, Stephan, Mul, Peter M., Tiemeijer, Peter C., Snoeck, Etienne

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 3.43 MB

english, 2004

10

Effects of negative energy components in the constituent quark model

Tiemeijer, Peter C., Tjon, J. A.

Journal:

Physical Review C

Year:

1993

Language:

english

File:

PDF, 286 KB

english, 1993

11

On-the-Fly Image Quality Evaluation for Single-Particle Analysis Cryo-Electron Microscopy

Yu, Lingbo, Franken, Erik, Voigt, Andreas, Grollios, Fanis, Tiemeijer, Peter, Reyntjens, Steve

Journal:

Microscopy and Microanalysis

Year:

2017

Language:

english

File:

PDF, 375 KB

english, 2017

12

Electron Vortex Beams for Magnetic Measurements on Ferromagnetic Samples via STEM

Pohl, Darius, Rusz, Jan, Schneider, Sebastian, Tiemeijer, Peter, Rellinghaus, Bernd

Journal:

Microscopy and Microanalysis

Year:

2015

Language:

english

File:

PDF, 224 KB

english, 2015

13

High Performance in Low Voltage HR-STEM Applications Enabled By Fast Automatic Tuning of the Combination of a Monochromator and Probe Cs-Corrector

Lazar, Sorin, Tiemeijer, Peter, Henstra, Sander, Dennemans, Terry, Ringnalda, Jan, Freitag, Bert

Journal:

Microscopy and Microanalysis

Year:

2016

Language:

english

File:

PDF, 737 KB

english, 2016

14

Atomic Scale Analysis of Planar Defects in Polycrystalline Diamond

Erni, Rolf, Freitag, Bert, Hartel, Peter, Müller, Heiko, Tiemeijer, Peter, van der Stam, Michiel, Stekelenburg, Mike, Hubert, Dominique, Specht, Petra, Garibay-Febles, Vincente

Journal:

Microscopy and Microanalysis

Year:

2006

Language:

english

File:

PDF, 601 KB

english, 2006

15

Atom size electron vortex beams with selectable orbital angular momentum

Pohl, Darius, Schneider, Sebastian, Zeiger, Paul, Rusz, Ján, Tiemeijer, Peter, Lazar, Sorin, Nielsch, Kornelius, Rellinghaus, Bernd

Journal:

Scientific Reports

Year:

2017

Language:

english

File:

PDF, 1.64 MB

english, 2017

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